Scanning Electron Mmicroscope (SEM) Laboratory

In charge: Raanan Bodzin


Description:
Scanning Electron Microscope (SEM), model FEI Quanta 450 equipped with Oxford EDS X-Max X-ray elemental analysis.


Types of analyses: 

Imaging, surface topology and differences in elemental compositions. Energy-dispersive X-ray spectroscopy (EDS) allows chemical characterization.


Contacts:
Naomi Porat : naomi.porat@gsi.gov.il


 

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